Spectroscopic Ellipsometry Short Workshop
2026-02-02 09:00 - 2026-02-04 17:00 | Research I
Day 1 Overview

* Basic theory
* Overview of Data Analysis Strategies
* Transparent layers
* Cauchy Dispersion
* Thickness PreFit
* Global Fit
* Roughness
* Index Grading

Day 2 Overview

* Parameterize Layer
* Absorbing Films
* Semi-Absorbing Films
* Wavelength Expansion Fits
* B-Spline
* Convert to Transparent B-Spline
* Gen-Osc
* Oscillator Model Theory

Day 3 Overview

* Fitting SE + Transmission
* Thin Absorbing Materials
* Multiple-Sample Analysis
* Mapping Data
* Review

Registration Link: https://www.jawoollam.com/resources/short-courses/2026-ucf-winter-completeease-short-course
