Events at UCF

Spectroscopic Ellipsometry Short Workshop

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Monday, February 2, 2026 9 a.m. to Wednesday, February 4 at 5 p.m.

Day 1 Overview

  • Basic theory
  • Overview of Data Analysis Strategies
  • Transparent layers
  • Cauchy Dispersion
  • Thickness PreFit
  • Global Fit
  • Roughness
  • Index Grading

Day 2 Overview

  • Parameterize Layer
  • Absorbing Films
  • Semi-Absorbing Films
  • Wavelength Expansion Fits
  • B-Spline
  • Convert to Transparent B-Spline
  • Gen-Osc
  • Oscillator Model Theory

Day 3 Overview

  • Fitting SE + Transmission
  • Thin Absorbing Materials
  • Multiple-Sample Analysis
  • Mapping Data
  • Review
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Location:

Research I

Event Registration

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Contact:

Parag Banerjee Parag.Banerjee@ucf.edu

Calendar:

Fall

Category:

Workshop/Conference

Tags:

Metrology JA Woollam Materials Characterization Spectroscopic Ellipsometry Thin films