Computer Science and Center for Research in Computer Vision
Speaker: Dr. Jae Oh Woo From: Samsung SDS Research America Abstract In this presentation titled "Quantifying Uncertainties of Deep Neural Networks and Its Applications," we delve into the critical task of measuring uncertainties in Deep Neural Networks. The talk will commence with a concise overview of various methodologies for quantifying uncertainty, underlining their significance in deep learning. Following this, we …
CS/CRCV Seminars